Related content

X-ray diffractometry diagnosis of laser diffusion of aluminum into silicon

By Bushuev V.   Petrakov A.  

Technical Physics, Vol. 45, Iss. 5, 2000-05 ,pp. : 613-617

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Investigation of silicon structures with periodically varying porosity by x-ray diffractometry methods

By Irzhak D.   Roshchupkin D.   Starkov V.   Fakhrtdinov R.  

Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol. 4, Iss. 6, 2010-11 ,pp. : 947-950

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

High resolution x-ray diffractometry of the structural characteristics of a semiconducting (InGa)As/GaAs superlattice

By Nesterets Ya.   Punegov V.   Pavlov K.   Faleev N.  

Technical Physics, Vol. 44, Iss. 2, 1999-02 ,pp. : 171-179

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

X-ray diffractometry and electrical conductivity of the ceramics LaSrAl(Cu,Ni)O₄

By Usachev A.   Petrashen’ V.   Yablokov Yu.   Ivanova T.   Kukovitskii E.  

Physics of the Solid State, Vol. 39, Iss. 6, 1997-06 ,pp. : 884-888

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite