Author: Moiseev K. Lesnikov V. Podolski V. Kudriavtsev Yu. Kudriavtseva O. Escobosa A. Sanchez-Resendiz V.
Publisher: MAIK Nauka/Interperiodica
ISSN: 1063-7826
Source: Semiconductors, Vol.45, Iss.6, 2011-06, pp. : 771-775
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Abstract
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