Evaluation of resistance of CMOS LSIC to the factor of absorbed dose under the pulsed radiation effect

By Sogoyan A.  

Russian Microelectronics, Vol. 40, Iss. 3, 2011-05 ,pp. : 185-193

MAIK Nauka/Interperiodica

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Estimating the IC upset/failure threshold of dose rate for a radiation pulse sequence

By Chumakov A.   Gontar’ V.  

Russian Microelectronics, Vol. 35, Iss. 3, 2006-05 ,pp. : 150-155

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Reliable study of digital IC circuits with margin voltage among variable DC power supply, electromagnetic interference and conducting wire antenna

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Microelectronics Reliability, Vol. 43, Iss. 12, 2003-12 ,pp. : 2001-2009

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Study and characterization of a new MOSFET voltage controlled negative resistance for super selective IC tank circuits

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International Journal of Electronics, Vol. 86, Iss. 3, 1999-03 ,pp. : 311-319

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Modeling of O-X-B conversion of electromagnetic radiation in tokamak plasmas

By Balakina M.   Shalashov A.   Gospodchikov E.   Smolyakova O.  

Radiophysics and Quantum Electronics, Vol. 49, Iss. 8, 2006-08 ,pp. : 617-632

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