Effect of small crystal tilt on atomic-resolution high-angle annular dark field STEM imaging

Author： Yamazaki T. Kawasaki M. Watanabe K. Hashimoto I. Shiojiri M.

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.92, Iss.3, 2002-08, pp. : 181-189

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

An approach to quantitative compositional profiling at near-atomic resolution using high-angle annular dark field imaging

By Anderson S.C. Birkeland C.R. Anstis G.R. Cockayne D.J.H.

Ultramicroscopy, Vol. 69, Iss. 2, 1997-09 ,pp. : 83-103

Elsevier

Access to resources Recommend Favorite

High-angle annular dark-field STEM observation of Xe nanocrystals embedded in Al

By Mitsuishi K. Kawasaki M. Takeguchi M. Yasuda H. Furuya K.

Ultramicroscopy, Vol. 88, Iss. 1, 2001-06 ,pp. : 25-31

Elsevier

Access to resources Recommend Favorite

Can high-angle annular dark field scattering be represented by a local operator?

By Rez P.

Ultramicroscopy, Vol. 81, Iss. 3, 2000-04 ,pp. : 195-202

Elsevier

Access to resources Recommend Favorite

A high efficiency annular dark field detector for STEM

By Kirkland E.J. Thomas M.G.

Ultramicroscopy, Vol. 62, Iss. 1, 1996-01 ,pp. : 79-88

Elsevier

Access to resources Recommend Favorite

Practical aspects of atomic resolution imaging and analysis in STEM - resolution and thickness effects

By James E.M. Browning N.D.

Ultramicroscopy, Vol. 78, Iss. 1, 1999-06 ,pp. : 125-139

Elsevier

Access to resources Recommend Favorite