Author: Moreau P. Cheynet M.C.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.94, Iss.3, 2003-04, pp. : 293-303
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Improved background-fitting algorithms for ionization edges in electron energy-loss spectra
Ultramicroscopy, Vol. 92, Iss. 2, 2002-07 ,pp. :
Background subtraction for low-loss transmission electron energy-loss spectroscopy
Ultramicroscopy, Vol. 93, Iss. 1, 2002-10 ,pp. :
Ab initio analysis of electron energy loss spectra for complex oxides
By Kostlmeier S. Elsasser C. Meyer B.
Ultramicroscopy, Vol. 80, Iss. 2, 1999-10 ,pp. :
Detecting low levels of transuranics with electron energy loss spectroscopy
Ultramicroscopy, Vol. 67, Iss. 1, 1997-06 ,pp. :