Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy

Author: Lazar S.   Botton G.A.   Wu M.-Y.   Tichelaar F.D.   Zandbergen H.W.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.96, Iss.3, 2003-09, pp. : 535-546

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract