An extended dislocation pile-up model for the yield strength of lamellar microstructures

Author: Sun Y. Q.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.77, Iss.4, 1998-04, pp. : 1107-1126

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Abstract