Atomic force microscopy in the surface characterization of semiconductors and superconductors

By Gonnelli R. S.  

Philosophical Magazine B, Vol. 80, Iss. 4, 2000-04 ,pp. : 599-609

Taylor & Francis Ltd

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Nanotribological characterization of industrial polytetrafluorethylene-based coatings by atomic force microscopy

By Podesta A.   Fantoni G.   Milani P.   Guida C.   Volponi S.  

Thin Solid Films, Vol. 419, Iss. 1, 2002-11 ,pp. : 154-159

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Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

By Fruhstorfer B.   Mohles V.   Reichelt R.   Nembach E.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 13, 2002-09 ,pp. : 2575-2589

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Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

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Characterization of room-temperature plastic deformation of -Si 3 N 4 by atomic force microscopy and transmission electron microscopy

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Philosophical Magazine Letters, Vol. 81, Iss. 9, 2001-09 ,pp. : 623-629

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