In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si(001) heterostructures

By Stach E. A.   Hull R.   Tromp R. M.   Ross F. M.   Reuter M. C.   Bean J. C.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 80, Iss. 9, 2000-09 ,pp. : 2159-2200

Taylor & Francis Ltd

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Direct observation of surface sublimation and relaxation in CdTe{111} films by high-resolution transmission electron microscopy

By Picu R. C.   Rankin J.   Schwartzman A. F.  

Philosophical Magazine Letters, Vol. 79, Iss. 5, 1999-05 ,pp. : 241-247

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Transmission electron microscopy analysis of the shape and size of semiconductor quantum dots

By Androussi Y.   Benabbas T.   Lefebvre A.  

Philosophical Magazine Letters, Vol. 79, Iss. 4, 1999-04 ,pp. : 201-208

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Determination of bulk mismatch values in transmission electron microscopy cross-sections of heterostructures by convergent-beam electron diffraction

By Balboni R.   Frabboni S.   Armigliato A.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 77, Iss. 1, 1998-01 ,pp. : 67-83

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Finite-element calculations on the behaviour of a DSC in temperature-modulated mode

By Hohne G.W.H.   Shenogina N.B.  

Thermochimica Acta, Vol. 310, Iss. 1, 1998-02 ,pp. : 47-51

Elsevier

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