Chemical analysis of grain boundaries using intense electron beams

Author: Shang P.   Keyse R.   Jones I. P.   Smallman R. E.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.10, 1999-10, pp. : 2539-2552

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Abstract