A high-resolution electron microscopy study of steps on lamellar gamma-alpha 2 interfaces in a low-misfit TiAl-based alloy

Author: Shang P.   Cheng T. T.   Aindow M.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.79, Iss.10, 1999-10, pp. : 2553-2575

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