Crystallographic characterization of sputter-deposited epitaxial Nb-Cu-Co and Nb-Cu-Permalloy multilayers using electron back-scatter diffraction patterns

Author： Loloee R.   Pratt W. P.   Crimp M. A.  

Publisher： Taylor & Francis Ltd

ISSN： 0141-8610

Source： Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.81, Iss.2, 2001-02, pp. : 261-273

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