Diffraction analysis of internal strain-stress fields in textured, transversely isotropic thin films: theoretical basis and simulation

Author： Leoni M. Welzel U. Lamparter P. Mittemeijer E. J. Kamminga J.-D.

Publisher： Taylor & Francis Ltd

ISSN： 0141-8610

Source： Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.81, Iss.3, 2001-03, pp. : 597-623

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