A transmission electron microscopy study of the deformation behavior underneath nanoindents in nanoscale Al-TiN multilayered composites

By Bhattacharyya D.  

Philosophical Magazine, Vol. 90, Iss. 13, 2010-05 ,pp. : 1711-1724

Taylor & Francis Ltd

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Characterization of room-temperature plastic deformation of -Si 3 N 4 by atomic force microscopy and transmission electron microscopy

By Milhet X.   Girard J. C.   Demenet J. L.   Rabier J.  

Philosophical Magazine Letters, Vol. 81, Iss. 9, 2001-09 ,pp. : 623-629

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

By Y.Huang J.   Park B. H.   Jan David   Pan X. Q.   Zhu Yuntian T.   Jia Q. X.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 82, Iss. 4, 2002-03 ,pp. : 735-749

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Transmission electron microscopy studies on structure and defects in crystalline yttria and lanthanum oxide thin films grown on single crystal sapphire by molecular beam synthesis

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Philosophical Magazine, Vol. 90, Iss. 9, 2010-03 ,pp. : 1123-1139

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X-ray and transmission electron microscopy characterization of twinned CdO thin films grown on a -plane sapphire by metalorganic vapour phase epitaxy

By Martínez-Tomás M.C.   Zúñiga-Pérez J.   Vennéguès P.   Tottereau O.   Muñoz-Sanjosé V.  

Applied Physics A, Vol. 88, Iss. 1, 2007-07 ,pp. : 61-64

Springer Publishing Company

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