Development and application of a combined atomic force microscopy–nanoindentation system with a silicon tip and a diamond indenter

Author: Miyahara K.   Nagashima N.   Matsuoka S.  

Publisher: Taylor & Francis Ltd

ISSN: 0141-8610

Source: Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol.82, Iss.10, 2002-07, pp. : 2149-2160

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract