INTERPRETATION OF OPTICAL DIAGNOSTICS FOR THE ANALYSIS OF LASER CRYSTALLIZATION OF AMORPHOUS SILICON FILMS

Author: Moon Seungjae   Lee Minghong   Hatano Mutsuko   Grigoropoulos Costas P.  

Publisher: Taylor & Francis Ltd

ISSN: 1091-7640

Source: Microscale Thermophysical Engineering, Vol.4, Iss.1, 2000-01, pp. : 25-38

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Abstract