Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits

By Miura Y.  

Journal of Electronic Testing, Vol. 18, Iss. 2, 2002-04 ,pp. : 109-120

Springer Publishing Company

Access to resources Recommend Favorite

A precise transient model for delayed input BiCMOS digital circuits

By Rofail Samir S.   Seng Yeo Kiat  

International Journal of Electronics, Vol. 83, Iss. 4, 1997-10 ,pp. : 441-454

Taylor & Francis Ltd

Access to resources Recommend Favorite

BiCMOS domino: a novel high-speed dynamic BiCMOS logic

By Menon Sankaran M.   Jayasumana Anura P.   Malaiya Yashwant K.  

International Journal of Electronics, Vol. 83, Iss. 2, 1997-08 ,pp. : 177-190

Taylor & Francis Ltd

Access to resources Recommend Favorite

Universal and robust testing of stuck-open faults in Reed-Muller canonical CMOS circuits

By Das Debesh K.   Chakraborty Susanta   Bhattacharya Bhargab B.  

International Journal of Electronics, Vol. 90, Iss. 1, 2003-01 ,pp. : 1-11

Taylor & Francis Ltd

Access to resources Recommend Favorite

Dynamic current testing for CMOS domino circuits

By Nazer Anis   Chehab Ali   Kayssi Ayman  

International Journal of Electronics, Vol. 95, Iss. 6, 2008-01 ,pp. : 577-592

Taylor & Francis Ltd

Access to resources Recommend Favorite