Simple estimation of the effect of hot-carrier degradation on scaled nMOSFETs

Author： Seekamp A.   Avellán A.   Schwantes S.   Krautschneider W.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3060

Source： International Journal of Electronics, Vol.90, Iss.10, 2003-10, pp. : 607-612

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