Breakdown voltage and on-resistance considerations in the floating islands metal-oxide semiconductor field-effect transistor

Author: Galadi A.  

Publisher: Taylor & Francis Ltd

ISSN: 1362-3060

Source: International Journal of Electronics, Vol.97, Iss.3, 2010-03, pp. : 241-247

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content