Identification strategy in the presence of corrupted measurements

Author: Allix O.   Feissel P.   Nguyen H.M.  

Publisher: Emerald Group Publishing Ltd

ISSN: 0264-4401

Source: Engineering Computations: Int J for Computer-Aided Engineering, Vol.22, Iss.5-6, 2005-07, pp. : 487-504

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Abstract