Extension and Depth of Perimetric Defects: Comparison of Short- Wavelength Automated Perimetry vs Conventional Perimetry

Author： Polo V. Larrosa J. M. Pablo L. E. Fernandez F. J. Honrubia F. M.

Publisher： Humana Press, Inc

ISSN： 1530-4086

Source： Annals of Ophthalmology, Vol.33, Iss.3, 2001-09, pp. : 221-224

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