Author: Señas A. Rodríguez Fernández J. Gómez Sal J.C. Goncharenko I.
Publisher: Taylor & Francis Ltd
ISSN: 0895-7959
Source: International Journal of High Pressure Research, Vol.22, Iss.1, 2002-01, pp. : 199-204
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Microstructure of annealed Ti48.5Ni(51.5-x)Cux (x = 6.2-33.5) thin films
Philosophical Magazine, Vol. 88, Iss. 16, 2008-06 ,pp. :
Shape memory behaviour of annealed Ti48.5Ni(51.5-x)Cux (x = 6.2-33.5) thin films
Philosophical Magazine, Vol. 88, Iss. 16, 2008-06 ,pp. :
Structural Study of the DyNi1-xCuxAl System
By Prchal J. Javorský P. Daniš S. Jurek K. Dlouhý J.
Czechoslovak Journal of Physics, Vol. 54, Iss. 4, 2004-12 ,pp. :