Effect of exposure and scattering on signal-to-noise ratio for improved defect sensitivity in X-ray radiography

Author: Saravanan T   Arunmuthu K   Philip John   Rao B Purna Chandra   Jayakumar T  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.55, Iss.10, 2013-10, pp. : 548-552

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