Failure mechanism of solder bubbles in PCB vias during high-temperature assembly

Author: Chen Yuanming   He Wei   Zhou Guoyun   Tao Zhihua   Wang Yang   Luo Daojun  

Publisher: Emerald Group Publishing Ltd

ISSN: 0305-6120

Source: Circuit World, Vol.39, Iss.3, 2013-08, pp. : 133-138

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Abstract