Direct Measurement of Repulsive van der Waals Interactions Using an Atomic Force Microscope

Author: Milling A.   Mulvaney P.   Larson I.  

Publisher: Academic Press

ISSN: 0021-9797

Source: Journal of Colloid and Interface Science, Vol.180, Iss.2, 1996-06, pp. : 460-465

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract