Evaluation of Cu/SnAg microbump bonding processes for 3D integration using wafer-level underfill film

Author: Yang Tsung-Fu   Kao Kuo-Shu   Cheng Ren-Chin   Chang Jing-Yao   Zhan Chau-Jie  

Publisher: Emerald Group Publishing Ltd

ISSN: 0954-0911

Source: Soldering & Surface Mount Technology, Vol.24, Iss.4, 2012-09, pp. : 287-293

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content