Thermal strain analysis of IC packages using various Moiré methods

Author: Zhong Z.W.  

Publisher: Emerald Group Publishing Ltd

ISSN: 1356-5362

Source: Microelectronics International, Vol.21, Iss.3, 2004-03, pp. : 25-28

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract