Effect of line resistance and driver width on crosstalk in coupled VLSI interconnects

Author: Kaushik Brajesh Kumar   Sarkar Sankar   Agarwal R.P.   Joshi R.C.  

Publisher: Emerald Group Publishing Ltd

ISSN: 1356-5362

Source: Microelectronics International, Vol.24, Iss.3, 2007-07, pp. : 42-45

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Abstract