Interferometry by Coherent Convergent-Beam Electron Diffraction

By Tsuda Kenji   Tanaka Michiyoshi  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 59-63

Oxford University Press

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decagonal quasicrystal, high-angle annular dark-field imaging, Z-contrast imaging, convergent-beam electron diffraction

By Saitoh K  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 197-203

Oxford University Press

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Local lattice parameter determination of a silicon (001) layer grown on a sapphire (11¯02) substrate using convergent-beam electron diffraction

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Journal of Electron Microscopy, Vol. 55, Iss. 3, 2006-06 ,pp. : 129-135

Oxford University Press

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Lattice parameter determination of a composition controlled Si 1−x Ge x layer on a Si (001) substrate using convergent-beam electron diffraction

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Journal of Electron Microscopy, Vol. 53, Iss. 6, 2004-12 ,pp. : 593-600

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Quantitative Electron Microdiffraction

By Spence J. C. H.  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 19-26

Oxford University Press

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