High-resolution low-dose scanning transmission electron microscopy

By Buban James P.   Ramasse Quentin   Gipson Bryant   Browning Nigel D.   Stahlberg Henning  

Journal of Electron Microscopy, Vol. 59, Iss. 2, 2010-04 ,pp. : 103-112

Oxford University Press

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

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A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples

By Yao Bo   Petrova Rumyana V.   Vanfleet Richard R.   Coffey Kevin R.  

Journal of Electron Microscopy, Vol. 55, Iss. 4, 2006-08 ,pp. : 209-214

Oxford University Press

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High-resolution transmission electron microscopy observation of the cross-sectional structure of reconstructed silicon (5,5,12) surface

By Liu J.   Takeguchi M.   Tanaka M.   Yasuda H.   Furuya K.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 541-544

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First observation of SiO 2 /Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy

By Tanaka* Nobuo  

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 69-73

Oxford University Press

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