Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

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Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 43-49

Oxford University Press

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Specimen preparation of porous Au for transmission electron microscopy using cryo ion-milling

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Journal of Electron Microscopy, Vol. 60, Iss. 1, 2011-02 ,pp. : 35-37

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A review of focused ion beam technology and its applications in transmission electron microscopy

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Reducing focused ion beam damage to transmission electron microscopy samples

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Fabrication of a TEM sample of ion-irradiated material using focused ion beam microprocessing and low-energy Ar ion milling

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Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 463-468

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