Polarity Determination for the Cd x Zn 1-x S Nanocombs by EELS

By Zhang X. Z.   Zhai T. Y.   Ma Y.   Yao J. N.   Yu D. P.  

Journal of Electron Microscopy, Vol. 57, Iss. 1, 2008-01 ,pp. : 7-11

Oxford University Press

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Measurement of mean free paths for inelastic electron scattering of Si and SiO 2

By Lee C-W.   Ikematsu Y.   Shindo D.  

Journal of Electron Microscopy, Vol. 51, Iss. 3, 2002-05 ,pp. : 143-148

Oxford University Press

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Local lattice parameter determination of a silicon (001) layer grown on a sapphire (11¯02) substrate using convergent-beam electron diffraction

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Journal of Electron Microscopy, Vol. 55, Iss. 3, 2006-06 ,pp. : 129-135

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Lattice parameter determination of a composition controlled Si 1−x Ge x layer on a Si (001) substrate using convergent-beam electron diffraction

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The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination

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Journal of Electron Microscopy, Vol. 53, Iss. 3, 2004-06 ,pp. : 237-244

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