Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling

By Eberg Espen   Monsen smund F.   Tybell Thomas   van Helvoort Antonius T. J.   Holmestad Randi  

Journal of Electron Microscopy, Vol. 57, Iss. 6, 2008-12 ,pp. : 175-179

Oxford University Press

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A specimen preparation technique for plane-view studies ofsurfaces using transmission electron microscopy

By Foss Steinar   Taft Johan   Haakenaasen Randi  

Journal of Electron Microscopy, Vol. 59, Iss. 1, 2010-02 ,pp. : 27-31

Oxford University Press

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First experiments of selected area nano-diffraction from semiconductor interfaces using a spherical aberration corrected TEM

By Yamasaki Jun  

Journal of Electron Microscopy, Vol. 54, Iss. 2, 2005-04 ,pp. : 123-126

Oxford University Press

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A new method for preparing plan-view TEM specimen of multilayered films using focused ion beam

By Kato Takeharu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 501-504

Oxford University Press

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Preparation of TEM samples of ferritic alloys

By Yao Z.   Xu S.   Jenkins M. L.   Kirk M. A.  

Journal of Electron Microscopy, Vol. 57, Iss. 3, 2008-06 ,pp. : 91-94

Oxford University Press

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