Author: Kimoto K. Anan Y. Asaka T. Zhigadlo N.D. Muromachi E. Matsui Y.
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.50, Iss.4, 2001-08, pp. : 307-310
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Spatially-resolved EELS analysis of multilayer using EFTEM and STEM
By Kimoto K.
Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. :
New Trends in STEM-Based Nano-EELS Analysis
Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. :