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Journal of Electron Microscopy, Vol. 58, Iss. 3, 2009-06 ,pp. : 157-165

Oxford University Press

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STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun

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Oxford University Press

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Experimental evaluation of a spherical aberration-corrected TEM and STEM

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