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Journal of Electron Microscopy, Vol. 57, Iss. 6, 2008-12 ,pp. : 189-194

Oxford University Press

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First observation of SiO 2 /Si(100) interfaces by spherical aberration‐corrected high‐resolution transmission electron microscopy

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Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy

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A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder

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