A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy

By Fukuda Muneyuki  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 479-483

Oxford University Press

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In situ observation of Pt nanoparticles on graphene layers under high temperature using aberration-corrected transmission electron microscopy

By Hashimoto Ayako   Takeguchi Masaki  

Journal of Electron Microscopy, Vol. 61, Iss. 6, 2012-12 ,pp. : 409-413

Oxford University Press

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Development of a technique for in situ high temperature TEM observation of catalysts in a highly moisturized air atmosphere

By Yaguchi Toshie   Kanemura Takashi   Shimizu Takahiro   Imamura Daichi   Watabe Akira   Kamino Takeo  

Journal of Electron Microscopy, Vol. 61, Iss. 4, 2012-08 ,pp. : 199-206

Oxford University Press

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Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

By Choi Pyuck-Pa   Kwon Young-Soon   Kim Ji-Soon   Al-Kassab Tala’at  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 43-49

Oxford University Press

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High-resolution low-dose scanning transmission electron microscopy

By Buban James P.   Ramasse Quentin   Gipson Bryant   Browning Nigel D.   Stahlberg Henning  

Journal of Electron Microscopy, Vol. 59, Iss. 2, 2010-04 ,pp. : 103-112

Oxford University Press

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