Microstructural analysis of the deformation range under nano-indentation in -SiC

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.53, Iss.5, 2004-10, pp. : 515-517

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

3D analysis of cracking behaviour under indentation in ion-irradiated -SiC

By Park Kyeong Hwan

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 511-513

Oxford University Press

Access to resources Recommend Favorite

Creep deformation of grain boundary in a highly crystalline SiC fibre

By Shibayama* T.

Journal of Electron Microscopy, Vol. 52, Iss. 1, 2003-03 ,pp. : 75-78

Oxford University Press

Access to resources Recommend Favorite

The structure of Si nanocrystals on SiC

By Kaiser U.

Journal of Electron Microscopy, Vol. 50, Iss. 4, 2001-08 ,pp. : 311-319

Oxford University Press

Access to resources Recommend Favorite

Application of FIB with micro pick-up to microstructural study of irradiated SiC/SiC composites

By Ozawa Kazumi

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 519-521

Oxford University Press

Access to resources Recommend Favorite

Recrystallization by annealing in SiC amorphized with Ne irradiation

By Aihara J. Hojou2 K. Furuno2 S. Ishihara1 M. Hayashi1 K.

Journal of Electron Microscopy, Vol. 51, Iss. 2, 2002-04 ,pp. : 93-98

Oxford University Press

Access to resources Recommend Favorite