The top–bottom effect of a tilted thick specimen and its influence on electron tomography

By Yang Chao   Zhang Hai-Bo   Li Jing-Jing   Takaoka Akio  

Journal of Electron Microscopy, Vol. 54, Iss. 4, 2005-08 ,pp. : 367-371

Oxford University Press

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Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope

By Zhang Hai-Bo   Wang Fang   Takaoka Akio  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 51-55

Oxford University Press

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Image blurring of thick specimens due to MeV transmission electron scattering: a Monte Carlo study

By Wang Fang   Zhang Hai-Bo   Cao Meng   Nishi Ryuji   Takaoka Akio  

Journal of Electron Microscopy, Vol. 60, Iss. 5, 2011-10 ,pp. : 315-320

Oxford University Press

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Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

By Ishitani Tohru   Kamiya Chisato   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 54, Iss. 2, 2005-04 ,pp. : 85-97

Oxford University Press

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Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy

By Ishitani Tohru   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 55, Iss. 5, 2006-10 ,pp. : 253-260

Oxford University Press

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