Reference sample for the evaluation of SEM image resolution at a high magnification—nanometer-scale Au particles on an HOPG substrate

Author： Okayama Shigeo Haraichi Satoshi Matsuhata Hirofumi

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.54, Iss.4, 2005-08, pp. : 345-350

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