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Transfer doublet and an elaborated phase plate holder for 120 kV electron-phase microscope

By Hosokawa Fumio,Danev Radostin,Arai Yoshihiro,Nagayama Kuniaki in (2005)

Oxford University Press

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Cathodoluminescence investigation of organic materials

By Niitsuma Jun-ichi,Oikawa Hidetoshi,Kimura Eiji,Ushiki Tatsuo,Sekiguchi Takashi in (2005)

Oxford University Press

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Theory of cathode trajectory characterization by canonical mapping transformation

By Fujita Shin,Shimoyama Hiroshi in (2005)

Oxford University Press

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Reference sample for the evaluation of SEM image resolution at a high magnification—nanometer-scale Au particles on an HOPG substrate

By Okayama Shigeo,Haraichi Satoshi,Matsuhata Hirofumi in (2005)

Oxford University Press

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2D-mapping of dopant distribution in deep sub micron CMOS devices by electron holography using adapted FIB-preparation

By Lenk Andreas,Lichte Hannes,Muehle Uwe in (2005)

Oxford University Press

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Noise in secondary electron emission: the low yield case

By Frank Luděk in (2005)

Oxford University Press

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The top–bottom effect of a tilted thick specimen and its influence on electron tomography

By Yang Chao,Zhang Hai-Bo,Li Jing-Jing,Takaoka Akio in (2005)

Oxford University Press

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Dark-field transmission electron microscopy for a tilt series of ordering alloys: toward electron tomography

By Kimura Kousuke,Hata Satoshi,Matsumura Syo,Horiuchi Takao in (2005)

Oxford University Press

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Micro-CT of Pseudocneorhinus bifasciatus by projection X-ray microscopy

By Tanisako Akira,Hori Ayumi,Okumura Aya,Miyata Chikara,Kuzuryu Chiaki,Obi Takashi,Yoshimura Hideyuki in (2005)

Oxford University Press

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Characterization of the degradation of recombinant rat urate oxidase in tetracycline controlled gene expression cells

By Pan Jie,Pan Xin,Wang Na,Ghazizadeh Mohammad,Yeldandi Anjana in (2005)

Oxford University Press

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