Lattice parameter determination of a composition controlled Si 1−x Ge x layer on a Si (001) substrate using convergent-beam electron diffraction

By Akaogi Takayuki   Tsuda Kenji   Terauchi Masami   Tanaka Michiyoshi  

Journal of Electron Microscopy, Vol. 53, Iss. 6, 2004-12 ,pp. : 593-600

Oxford University Press

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Interferometry by Coherent Convergent-Beam Electron Diffraction

By Tsuda Kenji   Tanaka Michiyoshi  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 59-63

Oxford University Press

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decagonal quasicrystal, high-angle annular dark-field imaging, Z-contrast imaging, convergent-beam electron diffraction

By Saitoh K  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 197-203

Oxford University Press

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Recent Advances in Quantitative Convergent Beam Electron Diffraction

By Saunders Martin   Midgley Paul   Vincent Roger   Steeds John  

Journal of Electron Microscopy, Vol. 45, Iss. 1, 1996-02 ,pp. : 11-18

Oxford University Press

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Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced current

By Kushida Takuya   Tanaka Shigeyasu   Morita Chiaki   Tanji Takayoshi   Ohshita Yoshio  

Journal of Electron Microscopy, Vol. 61, Iss. 5, 2012-10 ,pp. : 293-298

Oxford University Press

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