A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples

Author： Yao Bo   Petrova Rumyana V.   Vanfleet Richard R.   Coffey Kevin R.  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.55, Iss.4, 2006-08, pp. : 209-214

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