Influence of a combination of random noise and pattern-edge width (in pixels) on contrast-to-gradient image resolution in scanning electron microscopy

Author： Ishitani Tohru   Sato Mitsugu  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.55, Iss.5, 2006-10, pp. : 253-260

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Influence of random noise on the contrast-to-gradient image resolution in scanning electron microscopy

By Ishitani Tohru   Kamiya Chisato   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 54, Iss. 2, 2005-04 ,pp. : 85-97

Oxford University Press

Access to resources Recommend Favorite

Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy

By Ishitani Tohru   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 53, Iss. 3, 2004-06 ,pp. : 245-255

Oxford University Press

Access to resources Recommend Favorite

Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy

By Ishitani T.   Sato M.  

Journal of Electron Microscopy, Vol. 51, Iss. 6, 2002-11 ,pp. : 369-382

Oxford University Press

Access to resources Recommend Favorite

Evaluation of both image resolution and contrast-to-noise ratio in scanning electron microscopy

By Ishitani Tohru   Sato Mitsugu  

Journal of Electron Microscopy, Vol. 56, Iss. 4, 2007-08 ,pp. : 145-151

Oxford University Press

Access to resources Recommend Favorite

atomic-resolution Z-contrast scanning transmission electron microscopy, icosahedral quasicrystals, intermetallic compound

By Abe E   Takakura H   Tsai AP  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 187-195

Oxford University Press

Access to resources Recommend Favorite