Author: Kim Young-Min Lee Jeong Yong Moonen Daniel Jang Kang-Il Kim Youn-Joong
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.56, Iss.6, 2007-12, pp. : 217-224
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Pascher R. Berthold2 C-H. Rydmark1 2- M.
Journal of Electron Microscopy, Vol. 51, Iss. 2, 2002-04 ,pp. :