Author: Jarausch Konrad Leonard Donovan N.
Publisher: Oxford University Press
ISSN: 0022-0744
Source: Journal of Electron Microscopy, Vol.58, Iss.3, 2009-06, pp. : 175-183
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Taya Masaki Kawasaki Tadahiro Takai Yoshizo
Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. :
By Murata Kazuyoshi Nishimura Shinpei Kuniyasu Akihiko Nakayama Hitoshi
Journal of Electron Microscopy, Vol. 59, Iss. 3, 2010-06 ,pp. :