An in situ heating TEM analysis method for an interface reaction

Author： Tanigaki Toshiaki   Ito Katsuji   Nagakubo Yasuhira   Asakawa Takayuki   Kanemura Takashi  

Publisher： Oxford University Press

ISSN： 0022-0744

Source： Journal of Electron Microscopy, Vol.58, Iss.5, 2009-10, pp. : 281-287

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