Analytical TEM observation of Au and Ir deposited on rutile TiO 2

By Akita1 *- Tomoki   Okumura1 Mitsutaka   Tanaka1 Koji   Tsubota1 Susumu   Haruta2 Masatake  

Journal of Electron Microscopy, Vol. 52, Iss. 2, 2003-05 ,pp. : 119-124

Oxford University Press

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TEM Observation of Microstructures in RF-Sputtered Sm-Fe Magnetic Thin Films

By Sun Hong   Hanafusa Kenji   Kamei Kazuhito   Tomida Toshiro  

Journal of Electron Microscopy, Vol. 45, Iss. 5, 1996-10 ,pp. : 458-460

Oxford University Press

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Automated specimen search in cryo-TEM observation with DIFF-defocus imaging

By Nakamura Natsuko   Shimizu Yuko   Shinkawa Takao   Nakata Munetaka   Bammes Benjamin   Zhang Junjie   Chiu Wah  

Journal of Electron Microscopy, Vol. 59, Iss. 4, 2010-08 ,pp. : 299-310

Oxford University Press

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Vortex beams for atomic resolution dichroism

By Idrobo Juan C.   Pennycook Stephen J.  

Journal of Electron Microscopy, Vol. 60, Iss. 5, 2011-10 ,pp. : 295-300

Oxford University Press

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A new TEM method of interfacial thin-film characterization

By Li Chunfei  

Journal of Electron Microscopy, Vol. 54, Iss. 1, 2005-01 ,pp. : 57-60

Oxford University Press

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