Quantitative Surface Analysis by Fourier Transform Attenuated Total Reflection Infrared Spectroscopy

By Iwamoto Reikichi   Ohta Koji  

Applied Spectroscopy, Vol. 38, Iss. 3, 1984-05 ,pp. : 359-365

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Detection of Citrus Huanglongbing by Fourier Transform Infrared–Attenuated Total Reflection Spectroscopy

By Hawkins Samantha A.   Park Bosoon   Poole Gavin H.   Gottwald Timothy   Windham William R.   Lawrence Kurt C.  

Applied Spectroscopy, Vol. 64, Iss. 1, 2010-01 ,pp. : 100-103

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Improvement of the Limiting Thickness of the Measurable Surface Layer on Polymer Films Using Fourier Transform Infrared Attenuated Total Reflection Spectroscopy with the Use of Silver Island Films

By Nishikawa Yuji   Ito Yoshiaki   Fujiwara Kunihiro   Shima Tetsuo  

Applied Spectroscopy, Vol. 45, Iss. 5, 1991-06 ,pp. : 752-755

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Applications of Microstructured Silicon Wafers as Internal Reflection Elements in Attenuated Total Reflection Fourier Transform Infrared Spectroscopy

By Schumacher Henrik   Künzelmann Ulrich   Vasilev Boris   Eichhorn Klaus-Jochen   Bartha Johann W.  

Applied Spectroscopy, Vol. 64, Iss. 9, 2010-09 ,pp. : 1022-1027

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Discrimination of Soil-Borne Fungi Using Fourier Transform Infrared Attenuated Total Reflection Spectroscopy

By Linker Raphael   Tsror (Lahkim) Leah  

Applied Spectroscopy, Vol. 62, Iss. 3, 2008-03 ,pp. : 302-305

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