Evanescent Detection of Adsorbed Protein Concentration-Distance Profiles: Fit of Simple Models to Variable-Angle Total Internal Reflection Fluorescence Data

By Reichert W. M.   Suci P. A.   Ives J. T.   Andrade J. D.  

Applied Spectroscopy, Vol. 41, Iss. 3, 1987-03 ,pp. : 503-508

Society for Applied Spectroscopy

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Analysis of depth profile for impurity concentration in Si wafer by synchrotron radiation excited total reflection X-ray fluorescence spectroscopy

By Huh B.-K.   Kim J.-S.   Shin N.-S.   Koo Y.-M.   Chung H.-Y.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 8, 2003-08 ,pp. : 1445-1452

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Total Internal Reflection Raman Spectroscopy at the Critical Angle for Raman Measurements of Thin Films

By Iwamoto Reikichi   Ohta Koji   Miya Masaru   Mima Seiichi  

Applied Spectroscopy, Vol. 35, Iss. 6, 1981-11 ,pp. : 584-587

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The Seagull®: A Multifunctional Variable-Angle Reflection Attachment

By Milosevic M.   Harrick N. J.   Berets S. L.  

Applied Spectroscopy, Vol. 45, Iss. 1, 1991-01 ,pp. : 126-131

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Attenuated (but not Total) Internal Reflection FT-IR Spectroscopy of Thin Films

By Cantrell Will   Ewing George E.  

Applied Spectroscopy, Vol. 56, Iss. 5, 2002-05 ,pp. : 665-669

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